PARTNER CONTENT Given the size and complexity of modern semiconductor designs, functional verification has become a dominant phase in the development cycle. Coverage lies at the very heart of this ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

AI-powered test automation is redefining software reliability by reducing flaky tests, expanding coverage, and accelerating ...

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...