The use of hierarchical DFT methods is growing as design size and complexity stresses memory requirements and design schedules. Hierarchical DFT divides the design into smaller pieces, creates test ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

The reality of DFT for large and complex SoCs has introduced new risk into design schedules. DFT teams end up in the critical path to tape out while waiting for portions of the design to be complete, ...

Through generations of technology advances, I’ve seen that as a particular task gets more important and usually more complex, it becomes the target of automation and so becomes greatly simplified.

Design-for-test (DFT) is essential to ensure that complex designs can be thoroughly tested. Testing demands continue to increase as designs grow in gate count and fabrication process technologies ...

Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a ...

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...

As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex integrated ...

Test Development team is seeking a Silicon Design Engineer to have an exciting career on Scan, MBIST, iJTAG test development ...

Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a comprehensive review of ...