Electron microscopy is a powerful imaging technique that utilizes a beam of accelerated electrons to visualize and analyze the structure, composition, and properties of materials at the nanoscale.

Scanning electron microscopy (SEM) is an advanced analytical tool that massively outstrips the capabilities of traditional light microscopy. Using visible wavelengths of light on the 400 – 700 ...

Scanning electron microscopy (SEM) has been an important tool for forensic science since the 1970s, and it continues to find forensic applications today. The technique – capable of 100,000x ...

This degree of magnification and resolution is made possible by the use of a Focused Ion Beam Scanning Electron Microscope, or FIB-SEM. Ordinary microscopes will not produce the same results. Curious ...

One variation of electron microscopy is transmission electron microscopy (TEM). In a TEM experiment, the electron beam passes through the sample and the electrons are directly imaged onto an electron ...