Companies specializing in circuit board and system design-for-test (DFT) tools are pursuing a variety of strategies to serve test and debug applications based on innovations they announced over the ...
Boundary scan (IEEE 1149.1) evolved as a board-level test method, but new developments are making the technology attractive for embedded and system-level test and in-system programming operations.
Weybridge, England and Paris, France: Progressive-scan modules with digital output highlight Sony Europe's Image Sensing Solutions Division latest of colour block cameras. The use of progressive-scan ...
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