We find three major challenges are currently inhibiting the accuracy of test probe implementation: Inconsistent requirements in multi-die/chiplet assemblies ...

This article is dedicated to Jim Williams who several years ago (2006) wrote an article in EDN regarding the need of a good lab apparatus to qualify the behavior of voltage regulators for compliance ...

Lake Shore Cryotronics offers both high-vacuum and load-lock probe stations for measuring electrical, electro-optical, parametric, high-Z, DC, RF, and microwave properties of material and test devices ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...