In this interview, AZoMaterials speaks with Fernando Castro, Application Scientist at Gatan, about the latest advancements in 4D STEM orientation mapping using the newly released STEMx OIM software ...
In the field of scanning electron microscopy (SEM), the electron backscatter diffraction (EBSD) method has developed into a robust tool for the crystallographic analysis of materials. Specifically, ...
X-ray diffraction (XRD) is a powerful non-destructive analytical technique used to evaluate crystalline materials and determine their structural properties. As one of the most widely used ...
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