isixsigma on MSN

The Power of Special Cause Variation: Learning from Process Changes

Special cause variation, I love to see it! That’s because I know I’m about to learn something important about my process. A ...
EDN

Matsushita Uses Mentor DFM Tools to Measure Process Variability

Matsushita Electric Industrial Co. Ltd. said it is using Mentor Graphics Corp.’s Calibre OPCverify design-for-manufacturing (DFM) software for use in production at 65nm and below to examine the impact ...
isixsigma on MSN

The Complete Guide to Understanding Control Charts: How They Work, and Which to Use

A process is in control when you can predict how the process will vary (within limits) in the future. If the process is ...
Electronic Design

IP Helps Characterize Intra-Die Process Variability

DFM techniques can go only so far in ironing out intra-die process variability. That's because DFM techniques to date haven't fully addressed parametric yield issues. Stratosphere Solutions, a ...
Semiconductor Engineering

Controlling Variability Using Semiconductor Process Window Optimization

To ensure success in semiconductor technology development, process engineers must set the allowed ranges for wafer process parameters. Variability must be controlled, so that final fabricated devices ...
Semiconductor Engineering

Coping With Parallel Test Site-to-Site Variation

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...