Implementation of the 5G radio frequency (RF) standard is increasing rapidly [1]. Over the past four to six quarters, there has been an increased focus on publications and products that have been ...

Keithley Instruments recently announced that it is working with Mesatronic Group (Voiron, France) to develop advanced probe cards for Keithley semiconductor parametric testers used in RF and ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...

Langer EMV-Technik GmbH has introduced a new SX1 near-field probe set with a new member of the SX near-field probe family. SX probes in the set have probe-head high measurement resolution to allow a ...

The Siekoh Giken OEFS (Optical Electric Field Sensor) optically-coupled E-field probe is a very unique instrument (Figure 1). The company has developed a technology whereby the amplitude and frequency ...

The field strength used to determine radiated immunity must be accurately monitored during any test although the levels vary greatly from consumer to military applications. At high frequencies, this ...