A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between magnetic ground ...

Scanning probe microscopy is used to create images of nanoscale surfaces and structures or manipulate atoms to move them in specific patterns. It involves a physical probe that scans over the surface ...

Researchers have demonstrated a nondestructive way to observe nanoscale objects and processes in conditions simulating their normal operating environments. Their novel approach combines ultrathin ...

What is Scanning Microwave Microscopy? Scanning microwave microscopy (SMM) is a powerful imaging technique that combines the principles of atomic force microscopy (AFM) and microwave technology to ...

In recent decades, there has been an increased desire to miniaturize electronics, which, in turn, has enhanced the demand for nano-electrical characterization methods. It is crucial that an ...

A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid, ...

(Nanowerk News) NIST’s ability to determine the composition and physics of nanoscale materials and devices is about to improve dramatically with the arrival of a new near-field scanning microwave ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

In the sMIM approach, a microwave signal reflected from the interface between the tip and the sample retains information of the electrodynamic characteristics of the sample surface beneath the tip ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

There are several different types of scanning probe microscopes, the most prominent of which are atomic force microscopy (AFM) and scanning tunneling microscopy (STM). There are also many other types, ...

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents ...