Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

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The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...