Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

The Eclipse tools environment is being extended to support development of applications for large, parallel systems, an Eclipse official said at the EclipseCon 2005 conference on Tuesday. The Eclipse ...

Parallel Studio 2011 backs Visual Studio 2010 and adds a component to walk developers through the process of introducing parallelism Intel will release on Thursday an upgrade to its parallel ...

This file type includes high-resolution graphics and schematics when applicable. David J. Rodgers, Ethernet Alliance board of directors, and Senior Product Marketing Manager, Teledyne LeCroy Ethernet ...