At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

The effectiveness of semiconductor manufacturing test directly impacts the quality and reliability of shipped silicon and the economical efficiency of overall test costs within the supply chain.

A third-party report commissioned by Mountain Valley Pipeline developers has found the cause of a test failure in May was due to a manufacturer defect and not corrosion issues, a concern environmental ...

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...