As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Software testing plays a crucial role in ensuring the quality and reliability of applications. Two important testing approaches are component testing and end-to-end testing. Component testing focuses ...

Building a successful microwave test system requires the use of many different components to control signal flow, signal level, and signal integrity. The design engineer must consider the impact of ...