In situ XPS spectra of Ti 2p (a) and O 1s (b) in TiO2 in the dark and under illumination; (c) TOF-SIMS spectra of D depth profile of TiO2 in the dark and under illumination, in the mixture solution of ...
XPS is a very versatile method that has found extensive use in numerous application areas, from aerospace materials to contact lenses. XPS is unique in that it can quantify the chemical and elemental ...
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