Developing an effective and robust system for deepening our understanding of the characteristics of the tissue, structure, mechanical properties and organization of bone at the level of the nanoscale, ...

Soft X‐ray diffraction gratings coupled with advanced multilayer coatings represent a pivotal innovation in the development of high‐resolution spectroscopic instruments. These devices utilise periodic ...

Developing reliable and effective methods for the detection of explosive materials has become paramount in recent decades following high profile cases of terrorism, such as the events of 9/11. Since ...

Physiochemical properties such as solubility and dissolution rate play a crucial role when it comes to the therapeutic efficacy of oral drug formulations. According to the Biopharmaceutical ...

X-ray diffraction (XRD) is an essential technique to identify the structures and compositions of newly developed materials. However, XRD patterns consist of multiple peaks, and it is not always ...

X-ray diffraction (XRD) is an analytical method that probes the periodic arrangement of atoms in crystalline materials by measuring the angular distribution and intensity of X-rays scattered by the ...

X-ray diffraction (XRD) is a non-invasive method for determining that can be used in phase analysis investigations of crystalline materials. Image Credit: AgriTech/Shutterstock.com The essential idea ...

Our analytical XRD instrument utilises X-ray radiation to investigate the structure of crystallised biomolecular assemblies through X-ray diffraction (XRD). X-ray radiation is a type of ionising ...

X-ray crystallography, like mass spectroscopy and nuclear spectroscopy, is an extremely useful material characterization technique that is unfortunately hard for amateurs to perform. The physical ...

Smiths Detection has launched the SDX 10060 XDi, a ground- breaking X-ray scanner powered by diffraction technology. X-ray Diffraction (XRD) is a powerful inspection technology offering highly ...

“X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been ...