SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
For decades, optical inspection has been the primary method for process control in fabs. However, the move to multi-level ...
Applied’s new “cold field emission” technology works at room temperature, increasing nanoscale image resolution by up to 50% and imaging speed by up to 10X CFE eBeam technology enables leading ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Texas A&M AgriLife and the Office of Radiological Security (ORS), part of the National Nuclear Security Administration (NNSA), is teaming up on a national effort to combat New World screwworm, ...
Extended interaction devices encompass a range of microwave and terahertz sources that exploit multiple gap interactions between an electron beam and an engineered slow-wave structure. These devices ...
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