At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging” was published by researchers at Arizona State University. “Fan-out ...
While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult ...
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Korean scientists detect hidden defects in solar cells with 1,000x sensitivity boost
Korean researchers detect hidden semiconductor defects 1,000× more sensitively, boosting efficiency, lifespan, and design ...
Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital ICs. Delay testing uses TD (transition delay) patterns created by ATPG (automatic test ...
Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...
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