Abstract: The gate-all-around field-effect transistors (GAAFETs) are highly susceptible to performance variations caused by process-induced random variation. Line ...
Abstract: This paper presents a decentralized cooperative motion planning approach for surface inspection of 3D structures which includes uncertainties like size, number, shape, position, using ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback