Semiconductor Engineering

Maximize Your Revenue With High-Speed Test Performance Optimization

In today’s competitive semiconductor market, revenue growth is often associated with design innovation, process advancements, ...
Semiconductor Engineering

Analog Scan: Unlocking A New Era In Mixed-Signal Test

A methodology to create efficient manufacturing mixed-signal tests that reduce both test costs and test escapes.
IEEE

FPGA IP Core for DC Motor Control With Adaptive Neural Network PID Tuning, and High-Resolution Encoder Interface

Abstract: Traditional proportional integral derivative (PID) falls short for precise control of DC motor speed under changing conditions. This paper presents a novel FPGA based IP (intellectual ...