PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Unlike PCA (maximum variance) or ICA (maximum independence), ForeCA finds components that are maximally forecastable. This makes it ideal for time series analysis where prediction is often the primary ...

AI tools are frequently used in data visualization — this article describes how they can make data preparation more efficient ...