AI has been a powerful force in the embedded electronics industry, although it’s still in its infancy. It has a great promise to automate systems in every facet of the industry, yet it’s not a silver ...

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

Abstract: Boundary scan technology is a testing technology for large-scale integrated circuits. This is a new type of embedded testing technology that get the status and reads data of chip pins. This ...

Abstract: This article describes an experimental setup for testing the thermal and mechanical performance of pavement that includes transmitter (tx) coils designed for high-power dynamic wireless ...