Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

Extending the in‑field life of your silicon is essential for long‑term success and for staying ahead of your competitors in today’s rapidly evolving digital world of data centers, automotive and ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

A research team has developed a direct optical lithography (DOL) technology that patterns quantum dots (QDs) at ultra-high resolution using only light, without photoresist. Through this, they also ...