Abstract: In the era of terascale integration, the “reliability wall” and the “power wall” arise as barriers imposing significant challenges to the microprocessor industry. Nowadays, on-line testing ...
Abstract: Voids, cracks, and insufficient TIM volume hinder heat dissipation and jeopardize reliability of lidded high-performance microprocessors. Non-destructive tests can effectively inspect ...
Abstract: A superconductor single-flux-quantum (SFQ) logic 8-bit microprocessor is demonstrated up to 57.2 GHz with a measured power consumption of 11.2 mW. The microprocessor has an ultradeep, ...
Abstract: Compute-In-Memory (CIM), characterized by efficient matrix-vector multiplication, has been recognized as a promising candidate technology for edge AI computing. However, applying CIM in ...
Abstract: This research paper presents the findings of implementing low-power techniques on RISC V microprocessors using 90 nm technology. The power consumption of smaller microprocessors is a concern ...
Abstract: The design space exploration (DSE) of contemporary microprocessors faces a significant challenge of high-computational cost. In this context, we introduce Prior-boosted graph representation ...
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