The accelerating rate at which the industry adopts new process nodes is posing critical test challenges. Shrinking geometries combined with increased design complexity with respect to metrics such as ...

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

Compact IoT Module With Satellite, Cellular, and Positioning. Iridium Communications introduced the Iridium 9604, a compact IoT module that ...

In a significant advancement for lab-on-chip technology, IBEC researchers in the frame of the European project BLOC, have demonstrated the first integration of a benchtop nuclear magnetic resonance ...

With Nvidia spearheading the AI-RAN (Radio Access Network) push through the AI-RAN Alliance, field trials and tests are already underway, paving the path for early commercialization. According to ...

I appreciate the opportunity to be able to present a company update on Ideal Power to you. My name is David Somo, President and CEO of Ideal Power. As many of you know, I joined the company in ...

Abstract: With the growing integration of renewable energy sources, grid-connected converters are expected to provide overcurrent (OC) capability similar to those of synchronous generators. To address ...

Abstract: Power cycling test (PCT) is one of the most important tests to evaluate the packaging reliability of power electronics, which is much closer to the actual working condition when coupled with ...

Mitsubishi announced that it has begun shipping samples of two new S1-Series high-voltage IGBT modules rated at 1.7 kV. These two components are useful for large industrial equipment, such as railcars ...

Microchip Technology Inc. has announced a portfolio of IGBT 7 devices housed in different packages, offering multiple topologies and current and voltage ranges. Featuring increased power capability, ...