An international research team reports the discovery of "hidden order" in systems that are disordered in space and time. The paper is published in the journal Nature Materials. The results were ...

(a) The schematic of the fabricated ZnO device. Two-dimensional electron gas is formed between (Mg, Zn)O and ZnO. Quantum dots are formed by applying gate voltage to this two-dimensional electron gas.

An AI algorithm converts 2D electron microscope images into accurate 3D structures, cutting analysis time and cost to one-eighth while preserving precision. The newly developed algorithm requires ...

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...

Microplastics are tiny, plastic fragments — many too small to see — found in the air, soil and water. Measuring their abundance in nature can direct cleanup resources, but current detection methods ...

Since its discovery in 1999, the near-Earth asteroid Bennu has captivated scientists as a time capsule from the early solar system — and also as a key to possibly understanding the origins of life. To ...

Metallic nanoflowers may be the next frontier in brain health, reducing oxidative stress, protecting mitochondria, and even extending lifespan in lab models. A new study shows they hold “incredible ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

Today saw the full introduction of the requirements outlined in the Online Safety Act in the UK, requiring "robust" age checks for users to access adult content online. People have already managed to ...

At Texas A&M AgriLife Research, a new branch of brain science is blooming at the molecular scale—with nanoflowers. A study published in the Journal of Biological Chemistry demonstrated that ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.